near-Surface Materials Analysis in Real-Time (SMART)

We will perform real-time in-situ studies to advance our understanding of morphological changes taking place during fabrication and application of thin film systems as used for instance in hard coatings, high performance electronics and in sensors.

Our novel approach based on the unique properties of non-destructive ion beam-based probes provides highly accurate & depth-resolved near-surface information on composition and structure.

These unprecedented studies on model thin film systems of transition metal nitrides and oxides will reveal the connection of film chemistry, morphology and desired performance.We will:Establish manufacturing protocols allowing for a simultaneous in-situ composition depth profiling.Establish protocols to extract information on reaction kinematics and diffusion from isotopic labeling during growth.Study thermal stability of the compounds by in-situ thermal annealing.Study resistance to reactive ambients by in-situ gas exposure, combined with isotopic labelling.Investigate in-situ morphological changes during irradiation.where relevant combine (3) to (6)We plan to employ world-leading instrumentation at the national research infrastructure Ion Technology Center at Uppsala University.

The unique potential of ion-beam based probes for real-time analysis will be combined with world-leading ex-situ characterization conducted at the Myfab national infrastructure and together with our collaborators at Uppsala University and the RWTH Aachen.