Polarization sensitive photodetection by straining moiré van der Waals superlattices

The stacking of two dimensional materials with control of the relative twist angle led to the formation of long-range ordering structural modulation of the atomic lattices with the generation of moir potentials.

Twistronics is a blooming and promising new avenue to achieve optoelectronic devices with extra functionalities offering plenty of opportunities that can be combined with the well-established field of straintronics.

In this project, a number of layered materials combinations and straining methodologies will be investigated by in situ Atomic Force Microscopy-based methods such as Piezoresponse Force Microscopy, Kelvin Probe Force Microscopy and Tip-enhanced Raman spectroscopy to visualize the moir domains under strain.

Finally, the project endeavors to engineer photodetectors with strain-tunable polarization using marginally twisted strained van der Waals heterostructures.